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TopPage > Industrial Instruments > Proximity Aligner for R&D
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Wafer Surface Analyzer
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Aligner
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Proximity Aligner for R&D
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Proximity Aligner for R&D

Compact Proximity Aligner for R&D TME-400R
Desktop Proximity Aligner for R&D TME-150R

TME-400R (sample system for mass production)
TME-400R
(sample system for mass production)
TME-400R (sample system for prototyping)
TME-400R
(sample system for prototyping)
TME-150R
TME-150R
 

A compact proximity aligner for R&D allowing high-precision exposure.
Available in various fields including prototyping up to mass production of LCDs/organic ELs/micromachines/light guides and resist evaluation.
Supporting not only wafers but also glasses, ceramics and variety of other substrates.
A variety of options are provided. You can expand your system to an optimal one as you desired.
<Major specifications>
  TME-400R TME-150R
Exposure method Proximity
Resolution Proximity: 7 micronsL&S
Soft contact: 3 micronsL&S
(Different corresponding to the conditions)
Proximity: 6 micronsL&S
Soft contact: 2 micronsL&S
Hard contact: 0.5 micronsL&S
(Different corresponding to the conditions)
Available substrate size Max. 300 X 400 mm 50 to 200 mm dia.
40 X 40 to 150 X 150 mm
Available mask size Max. 340 X 440 mm 250 X 250 mm recommended
Illumination unevenness 5.0% or less
Overlay accuracy ±1.0 microns(with the automatic alignment used)
Gap setting range 0 to 500 microns 0 to 999 microns
Mask setting Manual
Dimensions of the system main unit 2900(W) X 2300(D) X 1950(H) mm 1200(W) X 1200(D) X 1700(H) mm
Weight of the system main unit Approx. 4000 kg Approx. 600 kg
Power supply 3-phase 200 V, 50/60 Hz 3-phase 100 V or 200 V, 50/60 Hz

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